DocumentCode
1599862
Title
Goos-Hanchen shift description in planar optical waveguides
Author
Rostami, A.
Author_Institution
Dept. Electr. Eng., Tabriz Univ., Iran
Volume
1
fYear
2003
Firstpage
663
Abstract
In this paper, using the Helmholtz wave equation and the tunneling time of a photon through an index of refraction barrier, the reflection delay time and reflection coefficient calculated and analytical expression for these quantities are introduced. It predicts that, the reflection delay time and coefficients depends on the refraction index, the thickness of barrier, the incident angle, and the incident wave frequency. Using these relations, we obtain the light penetration depths as well as horizontal shifts for reflection component of incident light to interface of two media. Our results completely describe the nature of Goos-Hanchen shifts in planar optical slab waveguides as a common device in optical integrated circuits (OIC). Also, the experimental data and our prediction completely close together.
Keywords
Helmholtz equations; light reflection; light refraction; optical planar waveguides; refractive index; Goos-Hanchen shift description; Helmholtz wave equation; barrier thickness; horizontal shifts; incident angle; incident light; incident wave frequency; light penetration depths; optical integrated circuits; planar optical slab waveguides; planar optical waveguides; reflection coefficient; reflection component; reflection delay time; refraction barrier; refraction index; tunneling time; Delay effects; Integrated optics; Optical devices; Optical planar waveguides; Optical reflection; Optical refraction; Optical waveguides; Partial differential equations; Planar waveguides; Propagation delay;
fLanguage
English
Publisher
ieee
Conference_Titel
Communication Technology Proceedings, 2003. ICCT 2003. International Conference on
Print_ISBN
7-5635-0686-1
Type
conf
DOI
10.1109/ICCT.2003.1209168
Filename
1209168
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