Title :
Common mode choke investigation for low pass filter application
Author :
Shafii, J. ; Chai, H. ; Gadow, R.
Author_Institution :
Hamilton Sundstrand Corp., Rockford, IL, USA
Abstract :
We have seen in EMI tests that adding additional turns to an EMI choke of a low pass filter actually worsens the conducted emissions. The reason for this is explained and demonstrated by analysis and by Pspice modeling of the EMI filter circuit and components. It is also demonstrated that the damping resistance of the EMI filter plays a very important role in EMI conducted emissions.
Keywords :
SPICE; electromagnetic interference; inductors; low-pass filters; EMI choke; EMI filter circuit; EMI tests; Pspice modeling; common mode choke investigation; low pass filter application; Capacitors; Current measurement; Inductance; Inductance measurement; Inductors; Noise; Noise measurement; common mode choke; conducted emission; electromagnetic interference; low pass filter;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
978-1-4577-0812-1
DOI :
10.1109/ISEMC.2011.6038308
