• DocumentCode
    1601131
  • Title

    The significant effect of the size of a nano-metal particle on the interface with a semiconductor substrate

  • Author

    Rezeq, Moh´d ; Ismail, Mohammed

  • Author_Institution
    Appl. Math. & Sci. Dept., Khalifa Univ. of Sci. Technol. & Res. (KUSTAR), Abu Dhabi, United Arab Emirates
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Reduced metal-semiconductor contacts to sub 10 nm range have exhibited interesting characteristics that drastically deviate from those related to planar Schottky contacts. We present a theoretical model with analytical analyses that describe the crucial effect of the size of the metal contact, with a semiconductor substrate, on the energy band structure at the interface. We present a direct method for calculating the reduced depletion width, the enhanced built-in potential and enhanced electric field at the interface. The calculations showed that these parameters are direct functions of the radius of the nano metal particle when the substrate is moderately doped and this particle´s radius effect diminishes when the sample is highly doped.
  • Keywords
    Fermi level; Schottky barriers; electric field effects; nanoparticles; semiconductor-metal boundaries; doping; electric field; energy band structure; metal-semiconductor contacts; nanometal particle; planar Schottky contacts; semiconductor substrate; size 10 nm; Atmospheric measurements; Electric fields; Electric potential; Metals; Particle measurements; Semiconductor device measurement; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
  • Conference_Location
    Birmingham
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4673-2198-3
  • Type

    conf

  • DOI
    10.1109/NANO.2012.6322080
  • Filename
    6322080