Title :
NEM relay based memory architectures for low power design
Author :
Venkatasubramanian, Ramakrishnan ; Manohar, Sujan K. ; Paduvalli, Vikas ; Balsara, Paras T.
Author_Institution :
Univ. of Texas at Dallas, Richardson, TX, USA
Abstract :
Nano-electromechanical (NEM) relays are a promising class of emerging devices that exhibit zero leakage operation. This work proposes three new NEM relay based parallel readout memory bitcell architectures that have faster access time, and remove the reliability issues associated with previously reported serial readout architectures. Accurate Verilog-A models were developed based on published fabrication results of NEM relays operating at 1V with a nominal air gap of 5 - 10nm. Bitcell stability and access time analysis are performed for all the proposed architectures and the results are presented.
Keywords :
circuit stability; integrated circuit modelling; integrated circuit reliability; low-power electronics; microrelays; read-only storage; readout electronics; NEM relay based memory architectures; Verilog-A models; access time analysis; bit cell stability; low power design; nanoelectromechanical relay; parallel readout memory bit cell architectures; reliability; serial readout architectures; voltage 1 V; Hardware design languages; Logic gates; Switches;
Conference_Titel :
Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
Conference_Location :
Birmingham
Print_ISBN :
978-1-4673-2198-3
DOI :
10.1109/NANO.2012.6322087