• DocumentCode
    160240
  • Title

    Copper thick-film substrates for power electronic applications

  • Author

    Blank, Tanya ; Leyrer, B. ; Maurer, Tobias ; Meisser, M. ; Bruns, M. ; Weber, Matthias

  • Author_Institution
    Inst. for Data Process. & Electron., Karlsruhe Inst. of Technol., Karlsruhe, Germany
  • fYear
    2014
  • fDate
    16-18 Sept. 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Substrates for high power electronic systems are dominated by DCB-technology. Recently, new copper thick-film pastes have been proposed for use as high power substrates. They are compatible with Al2O3- and pre-oxised AlN-substrates. This paper investigates production processes to build up highly reliable power modules and explores basis electrical and thermal properties of thick-film copper substrates. Fired copper film thicknesses of 300 μm have been produced by subsequent print-dry-fire cycles. Smooth surfaces and copper films with a density of about 70 % of bulk copper have been produced. A power module comprising of 650 V IGBTs, diodes and an intelligent hall sensor with copper traces and spaces of 200 μm is presented. Wire bonding processes on copper thick-films with 500 μm aluminium wire and 400 μm copper wire are discussed. Test units with a 1200 V IGBT were built up. The IGBT was attached at 250 °C and a pressure of 15 MPa using a novel silver sinter paste. This paste can be directly used on copper. The current-carrying capacity of the thick-film test samples was found to be reduced by 10% in comparison to the DCB test device. No significant difference was found in the performance of both technologies in active power pulse tests lasting a few seconds. The number of cycles for test devices with sintered chips, bonded with 400 μm copper wire bonds exceeded 450,000 cycles in a cycles from 25 °C up to 150 °C.
  • Keywords
    alumina; copper; lead bonding; power electronics; silver; sintering; thick film devices; Ag; Al2O3; AlN; Cu; DCB test device; IGBT; active power pulse tests; current-carrying capacity; diodes; electrical properties; high power electronic systems; intelligent hall sensor; power module; pre-oxised substrates; pressure 15 MPa; print-dry-fire cycles; sinter paste; sintered chips; size 300 mum; temperature 250 degC; thermal properties; thick-film pastes; thick-film substrates; voltage 1200 V; voltage 650 V; wire bonding processes; Bonding; Copper; Insulated gate bipolar transistors; Reliability; Silver; Substrates; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics System-Integration Technology Conference (ESTC), 2014
  • Conference_Location
    Helsinki
  • Type

    conf

  • DOI
    10.1109/ESTC.2014.6962860
  • Filename
    6962860