DocumentCode
1606372
Title
Opportunities and Challenges in Multi-Times-Programmable Floating-Gate Logic Non-Volatile Memories
Author
Wang, Bin ; Ma, Yanjun
Author_Institution
Impinj Inc., Seattle, WA
fYear
2008
Firstpage
22
Lastpage
25
Abstract
Low bit count floating gate (FG) logic NVM (LNVM) developed in baseline logic process is finding increasing use in system-on-chip (SOC) ICs due to its low cost and absence of extra process integration needs. This paper reviews the opportunities this technology brings to the eNVM fields and the technical challenges it faces. It also demonstrates that FG logic NVM is scalable to have 50A tunneling oxide to store the charge at 65 nm CMOS technology node and beyond.
Keywords
logic design; system-on-chip; CMOS; floating gate logic nonvolatile memories; system-on-chip; CMOS logic circuits; CMOS process; CMOS technology; Costs; Logic programming; Nonvolatile memory; Process design; Read-write memory; System-on-a-chip; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Non-Volatile Semiconductor Memory Workshop, 2008 and 2008 International Conference on Memory Technology and Design. NVSMW/ICMTD 2008. Joint
Conference_Location
Opio
Print_ISBN
978-1-4244-1546-5
Electronic_ISBN
978-1-4244-1547-2
Type
conf
DOI
10.1109/NVSMW.2008.12
Filename
4531812
Link To Document