• DocumentCode
    1607296
  • Title

    TF012 - high temperature sputtering of barium strontium titanate on nickel foils

  • Author

    Aygun, Seymen M. ; Daniels, Patrick ; Borland, William ; Maria, Jon-Paul

  • Author_Institution
    Department of Materials Science and Engineering, North Carolina State University, Raleigh, 27695 USA
  • Volume
    3
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The effects of sputtering temperature on the dielectric properties and the microstructure of barium strontium titanate thin films have been investigated. (Ba0.6Sr0.4)TiO3 films were deposited on Ni foils by radio frequency magnetron sputtering at temperatures between 100-450 ??C. Pt top electrodes were sputtered and the metal-insulator-metal configuration was obtained. The capacitors were subsequently co-fired at 900 ??C for crystallization and densification in a reducing atmosphere to avoid oxidation of Ni. The permittivity and the tunability of the films were observed to increase with the sputtering temperature, reaching a maximum at 400 ??C with a permittivity of 1800 and a tunability ratio of 10:1 at an applied electric field of 45 V/μm. Loss tangents were less than 1.5% at 10 kHz. The formation of NiO was observed in samples sputtered at temperatures above 450 ??C and resulted in degraded dielectric properties. Atomic force microscopy images revealed increasing grain size with the increasing sputtering temperature. This microstructural trend accounts for the increasing permittivity values and sharper ferroelectric anomalies found in films processed with increasing sputter temperature.
  • Keywords
    Atomic force microscopy; Barium; Dielectric thin films; Magnetic properties; Nickel; Permittivity; Sputtering; Strontium; Temperature; Titanium compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
  • Conference_Location
    Santa Re, NM, USA
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-2744-4
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2008.4693852
  • Filename
    4693852