• DocumentCode
    1607403
  • Title

    Characteristic Parameters of MTF of the Retina-Brain System

  • Author

    Bixin, Zeng ; Shisu, Chen

  • Author_Institution
    Dept. of Phys., Wenzhou Med. Coll.
  • fYear
    2005
  • fDate
    6/27/1905 12:00:00 AM
  • Firstpage
    1224
  • Lastpage
    1227
  • Abstract
    This paper aims to search parameters characterizing the MTF curve of retina-brain system of the human eye for distinguishing eye disease use. Suppose the MTF can be expressed by (for symmetric MTF) or (for asymmetric MTF). Let y = ln(MTF), x = lnf, the above formula can be transformed into y = k1x+... (for symmetric MTF) or y = k1´x+...(for asymmetric MTF ). Parameters kis( or ki´s) are determined by curve fitting from experimental data and used as discriminating indices to indicate various eye diseases. The effectivity of the curve fitting is evaluated by F test. The fitting parameters and the peak frequencies, fc, of MTF for normal eyes and eyes with diseases are shown in table 1 with corresponding F value and F value under 0.01 confidence level. The experimental data are taken from Wang´s paper for normal eyes, and Fang´s paper for eyes with diseases. It seems that the parameters kis (or ki´s) can be used as the indices to distinguish eye diseases because they are remarkably different for normal and various eye diseases. In curve fitting, there are reasons to use cubic equations for symmetric MTF (as in the case of cataracts) and quadratic equation for asymmetric MTF (as in the case of amblyopia)
  • Keywords
    brain; curve fitting; diseases; eye; optical transfer function; statistical analysis; F test; MTF; amblyopia; cataracts; cubic equations; curve fitting; eye disease; human eye; modulation transfer function; quadratic equation; retina-brain system; Curve fitting; Diseases; Equations; Eyes; Frequency; Humans; Optical imaging; Physics; Testing; Vision defects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2005. IEEE-EMBS 2005. 27th Annual International Conference of the
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-8741-4
  • Type

    conf

  • DOI
    10.1109/IEMBS.2005.1616645
  • Filename
    1616645