• DocumentCode
    1608741
  • Title

    Influence of interface states on C-V characteristics of AlGaN/GaN heterostructures

  • Author

    Osvald, J.

  • Author_Institution
    Inst. of Electr. Eng., Slovak Acad. of Sci., Bratislava, Slovakia
  • fYear
    2010
  • Firstpage
    167
  • Lastpage
    170
  • Abstract
    We tried to assess the influence of interface states between AlGaN barrier and GaN buffer layer and interface states on C-V characteristics of the AlGaN/GaN structure. Interface donor states were modelled with discrete peak distribution in energy with certain energy with respect to the conduction band minimum and also by continuous distribution of interface traps in energy. We found that interface states shift C-V curves to more negative voltages and change the plateau of C-V curves as well as do deep levels situated in AlGaN layer and the deep levels in GaN change the slope of capacitance decrease after the two-dimensional electron gas depletion.
  • Keywords
    electron gas; gallium compounds; high electron mobility transistors; silver compounds; AlGaN-GaN; C-V characteristics; buffer layer; discrete peak distribution; interface states; interface traps; two-dimensional electron gas depletion; Aluminum gallium nitride; Capacitance; Capacitance-voltage characteristics; Frequency measurement; Gallium nitride; Interface states; Semiconductor process modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Devices & Microsystems (ASDAM), 2010 8th International Conference on
  • Conference_Location
    Smolenice
  • Print_ISBN
    978-1-4244-8574-1
  • Type

    conf

  • DOI
    10.1109/ASDAM.2010.5666330
  • Filename
    5666330