DocumentCode
1608741
Title
Influence of interface states on C-V characteristics of AlGaN/GaN heterostructures
Author
Osvald, J.
Author_Institution
Inst. of Electr. Eng., Slovak Acad. of Sci., Bratislava, Slovakia
fYear
2010
Firstpage
167
Lastpage
170
Abstract
We tried to assess the influence of interface states between AlGaN barrier and GaN buffer layer and interface states on C-V characteristics of the AlGaN/GaN structure. Interface donor states were modelled with discrete peak distribution in energy with certain energy with respect to the conduction band minimum and also by continuous distribution of interface traps in energy. We found that interface states shift C-V curves to more negative voltages and change the plateau of C-V curves as well as do deep levels situated in AlGaN layer and the deep levels in GaN change the slope of capacitance decrease after the two-dimensional electron gas depletion.
Keywords
electron gas; gallium compounds; high electron mobility transistors; silver compounds; AlGaN-GaN; C-V characteristics; buffer layer; discrete peak distribution; interface states; interface traps; two-dimensional electron gas depletion; Aluminum gallium nitride; Capacitance; Capacitance-voltage characteristics; Frequency measurement; Gallium nitride; Interface states; Semiconductor process modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Devices & Microsystems (ASDAM), 2010 8th International Conference on
Conference_Location
Smolenice
Print_ISBN
978-1-4244-8574-1
Type
conf
DOI
10.1109/ASDAM.2010.5666330
Filename
5666330
Link To Document