• DocumentCode
    1609787
  • Title

    Composite bitmap visualization techniques for advanced ferroelectric memories

  • Author

    Eliason, J. ; Staubs, P. ; Groat, J. ; Rodriguez, J.

  • Author_Institution
    Ramtron International Corporation, Colorado Springs, 80921, USA
  • Volume
    1
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The year 2007 was a breakout year for advanced F-RAM. Two products manufactured on Texas Instruments?? 130nm ferroelectric memory process are now commercially available from Ramtron, and TI announced its intention to leverage the benefits of F-RAM in next generation RFID products. New composite bitmap visualization software created by Ramtron aided the development of a reliable process and manufacturable products. This paper will describe and demonstrate some of the powerful data analysis techniques enabled by this software.
  • Keywords
    Capacitors; Data analysis; Ferroelectric materials; Instruments; Manufacturing processes; Random access memory; Springs; Testing; Visualization; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
  • Conference_Location
    Santa Re, NM, USA
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-2744-4
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2008.4693961
  • Filename
    4693961
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1609787