Title :
Bandwidth extension of metamaterials with low reflectivity
Author :
Huang, Ruifeng ; Li, Zheng-Wen ; Liu, Lie ; Kong, Ling Bing
Author_Institution :
Temasek Labs., Nat. Univ. of Singapore, Singapore, Singapore
Abstract :
Following introduction of a figure of merit to quantify the thickness-normalized bandwidth of metamaterials for reflectivity reduction from metallic surfaces, possible methods are explored to design broadband metamaterials with low reflectivity. It is presented that the static permeability of substrate, the frequency-dispersion of permeability and permittivity of substrate, and the metallic resonant patterns all determine the figure of merit, and in turn the bandwidth of broadband metamaterials. Both numerical and experimental examples are included to validate the designs.
Keywords :
metamaterials; permeability; reflectivity; bandwidth extension; broadband metamaterial design; figure of merit; metallic surfaces; reflectivity reduction; substrate static permeability; thickness-normalized bandwidth; Bandwidth; Magnetic materials; Metamaterials; Permeability; Reflectivity; Resonant frequency; Substrates; Metamaterial; bandwidth; figure of merit; reflectivity;
Conference_Titel :
Microwave Conference Proceedings (APMC), 2011 Asia-Pacific
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-4577-2034-5