Abstract :
Presents the table of contents of the proceedings.
Keywords :
Dielectric breakdown; Electrons; Failure analysis; High-K gate dielectrics; Magnetic force microscopy; Microelectronics; Semiconductor device breakdown; Semiconductor device manufacture; Semiconductor device reliability; Sun;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the
Conference_Location :
Taiwan
Print_ISBN :
0-7803-8454-7
DOI :
10.1109/IPFA.2004.1345513
