Title :
Neobit/sup /spl reg// - high reliable logic non-volatile memory (NVM)
Author :
Wang, R.S.C. ; Shen, R.S.J. ; Hsu, C.C.H.
Author_Institution :
eMemory Technol. Inc., Hsin-Chu, Taiwan
Abstract :
In this paper, a new embedded OTP bit-cell (Neobit) is presented for one-/multiple-time programming (OTP/MTP) application, which is fabricated by using a generic logic process. Without additional processing or extra fabrication cost, this single-poly NVM can be implemented in various CMOS technologies such as logic, mixed-mode, analog, RF, HV and etc. Due to its easy incorporation with any IC design, this single-poly NVM can be comprehensively used for program storage in micro controllers, device identification in IC cards and network IC, code storage in RFID tag, fuse device in memory redundancy, and RC trimming in analog/RF circuits.
Keywords :
CMOS memory circuits; analogue processing circuits; electric fuses; embedded systems; identification technology; integrated circuit design; integrated circuit interconnections; mixed analogue-digital integrated circuits; random-access storage; redundancy; CMOS logic; CMOS technologies; HV CMOS; IC cards; IC design; MTP; Neobit high reliability logic nonvolatile memory; RC trimming; RF CMOS; RFID tag; analog CMOS; analog/RF circuits; code storage; device identification; embedded OTP bit-cell; fabrication cost; fuse device; generic logic process; memory redundancy; micro controllers; mixed-mode CMOS; multiple-time programming application; network IC; one-time programming application; program storage; single-poly NVM;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the
Conference_Location :
Taiwan
Print_ISBN :
0-7803-8454-7
DOI :
10.1109/IPFA.2004.1345558
