Title :
A combinatorial method for the evaluation of yield of fault-tolerant systems-on-chip
Author :
Munteanu, Doru P. ; Sune, Victor ; Rodriguez-Montanes, Rosa ; Carrasco, Juan A.
Author_Institution :
Military Technical Academy
Keywords :
Boolean functions; Data structures; Error correction; Fault tolerance; Fault tolerant systems; Intellectual property; Network-on-a-chip; System-on-a-chip; Virtual manufacturing; Yield estimation;
Conference_Titel :
Dependable Systems and Networks, 2003. Proceedings. 2003 International Conference on
Print_ISBN :
0-7695-1952-0
DOI :
10.1109/DSN.2003.1209966
