DocumentCode :
1613995
Title :
Adaptive circuits for the 0.5-V nanoscale CMOS era
Author :
Itoh, Kiyoo
Author_Institution :
Hitachi, Tokyo
fYear :
2009
Firstpage :
14
Lastpage :
20
Abstract :
The Vmins of logic, SRAM, and DRAM blocks were compared with a newly proposed methodology for evaluating Vmin based on speed variations, taking repair techniques into account. State-of-the-art 6T SRAM cells were then discussed in terms of Vmin and cell size. After that, many adaptive circuits and relevant technologies needed to break the 1V wall were proposed and evaluated, while taking the interconnect problem into account. Finally, 0.5 V nanoscale LSIs including mixed signal LSIs were predicted to be feasible, if relevant devices and fabrication processes are developed.
Keywords :
CMOS logic circuits; CMOS memory circuits; DRAM chips; SRAM chips; large scale integration; mixed analogue-digital integrated circuits; nanoelectronics; DRAM block; SRAM cell; adaptive circuits; fabrication process; interconnect problem; logic circuits; mixed signal LSI; nanoscale CMOS; voltage 0.5 V; CMOS logic circuits; Degradation; Delay; Large scale integration; Logic devices; Logic gates; MOSFETs; Power supplies; Random access memory; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-3458-9
Type :
conf
DOI :
10.1109/ISSCC.2009.4977291
Filename :
4977291
Link To Document :
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