Design-for-Diagnosis Architecture for Power Switches

Author

Valka, M. ; Bosio, A. ; Dilillo, L. ; Girard, P. ; Virazel, A. ; Debaud, P. ; Guilhot, S.

Author_Institution

TIMA, Grenoble, France

fYear

2015

Firstpage

43

Lastpage

48

Abstract

Power-gating techniques have been adopted so far to reduce the static power consumption of an Integrated Circuit (IC). Power-gating is usually implemented by means of several power switches. Manufacturing defects affecting power switches can lead to increase the actual static power consumption and, in the worst case, they can completely isolate a functional block in the IC. Thus, efficient test and diagnosis solutions are needed. In this paper we propose a Design-for-Diagnosis architecture for Power Switches. The proposed approach has been validated through SPICE simulations on ITC´99 benchmark circuits as well as on industrial test case.

Keywords

design for testability; integrated circuit design; power integrated circuits; design-for-diagnosis architecture; integrated circuit; power switches; power-gating techniques; static power consumption; Circuit faults; Integrated circuits; Monitoring; Power demand; Silicon; Switches; Transistors; Design for Diagnosis; Design for Test; Power Management; Power Switch;

fLanguage

English

Publisher

ieee

Conference_Titel

Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2015 IEEE 18th International Symposium on

Conference_Location

Belgrade

Print_ISBN

978-1-4799-6779-7

Type

conf

DOI

10.1109/DDECS.2015.18

Filename

7195666