DocumentCode :
1616424
Title :
Stacked Annular form Factor Film Capacitors for High Voltage and High Current Applications
Author :
Hosking, Terry A. ; Brubaker, Michael A.
Author_Institution :
SBE Inc., Barre
fYear :
2007
Firstpage :
267
Lastpage :
267
Abstract :
Summary form only given. An annular form factor dry film capacitor having the minimum possible Equivalent Series Inductance (ESL) has been developed for short pulse applications requiring high currents at voltages below 10 kV DC. This part is based on a multi-section design, which provides very good voltage grading between the end faces of the capacitor. This grading is preserved when using the capacitor as a building block for a stacked series assembly to realize much higher operating voltages. As such, the dielectric design of the resulting assembly is greatly simplified. Furthermore, the annular form factor greatly simplifies interconnections between capacitors, thus providing a high voltage capacitor stack with an ESL comparable to conventional configurations. Electrical and mechanical aspects of series stacked annular capacitors are discussed, including interconnect conductive "gasket" materials and mechanical clamping arrangements. A stacked capacitor design is presented along with preliminary test data.
Keywords :
inductance; integrated circuit interconnections; thin film capacitors; annular form factor dry film capacitor; equivalent series inductance; interconnect conductive gasket materials; mechanical clamping arrangements; stacked series assembly; voltage capacitor stack; Assembly; Capacitors; Clamps; Conducting materials; Dielectric materials; Gaskets; Inductance; Testing; USA Councils; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
Conference_Location :
Albuquerque, NM
ISSN :
0730-9244
Print_ISBN :
978-1-4244-0915-0
Type :
conf
DOI :
10.1109/PPPS.2007.4345573
Filename :
4345573
Link To Document :
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