Title :
A self-calibration method for fast, high resolution A/D and D/A converters
Author_Institution :
Fraunhofer Inst. of Microelctron. Circuits & Syst., Duisburg, West Germany
Abstract :
Monolithic A/D (analog-to-digital) and D/A (digital-to-analog) converters suffer from the limited accuracy of the available circuit components. A new self-calibration method allows the correction of the linearity errors of binary weighted current source arrays commonly used in high-speed converters. In order to achieve high-calibration accuracy, a modified dual-slope method is used. This makes it possible to implement A/D and D/A converters with a resolution of 14 b or more at a conversion time of less than 15 μs
Keywords :
analogue-digital conversion; calibration; digital-analogue conversion; 15 mus; A/D convertors; ADC; D/A converters; DAC; binary weighted current source arrays; conversion time; error correction; high resolution; high-speed converters; linearity errors; modified dual-slope method; monolithic type; self-calibration method; Calibration; Circuits and systems; Control systems; Error correction; Linearity; Logic circuits; Microelectronics; Quantization; Signal resolution; Technological innovation;
Conference_Titel :
Circuits and Systems, 1989., IEEE International Symposium on
Conference_Location :
Portland, OR
DOI :
10.1109/ISCAS.1989.100343
