Title :
[Front inside cover]
Abstract :
The following topics are dealt with: on-chip protection in emerging CMOS technologies; analysis of factory processes; on-chip design for CMOS; properties of materials; ESD device physics;system-level design; ESD electronic design automation; system-level characterization cases; on-chip protection for high voltage applications; transient test techniques; RF and high voltage design; case studies of ESD failures; electrostatic control in manufacturing; and modeling of ESD testers.
Keywords :
CMOS integrated circuits; electrostatic discharge; CMOS technologies; ESD device physics; ESD electronic design automation; ESD failures; ESD tester modeling; RF; electrical overstress; electrostatic control; electrostatic discharge; factory processes; high voltage applications; high voltage design; manufacturing; on-chip design; on-chip protection; system level characterization cases; system level design; transient test techniques;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location :
Las Vegas, NV
