• DocumentCode
    1619230
  • Title

    Power-to-failure investigation for PNP-based ESD protections: From ns to ms

  • Author

    Cerati, Lorenzo ; Di Biccari, Leonardo ; Andreini, Antonio ; Castiglione, Corrado ; Blanc, Daisy

  • Author_Institution
    STMicroelectron., Agrate Brianza, Italy
  • fYear
    2013
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Power-to-Failure of PNP transistors used as ESD protection devices is analysed in this work both at experimental and simulation level. A complete analysis from ns to ms range is provided to evaluate the overall robustness of this solution not only for ESD events but also for EOS-like stresses.
  • Keywords
    electrostatic discharge; transistors; EOS; ESD protection devices; PNP transistors; power-to-failure investigation; Computer architecture; Data models; Electrostatic discharges; Performance evaluation; Robustness; Stress; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0739-5159
  • Type

    conf

  • Filename
    6635913
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1619230