Title :
Voltage sag stochastic estimate
Author :
Alves, Mário F. ; Fonseca, Viviane R C
Author_Institution :
Pontificia Univ. Catolica de Minas Gerais, Belo Horizonte, MG, Brazil
Abstract :
The probabilistic nature of the electromagnetic phenomenon that characterizes a voltage sag makes the establishment of tendencies based only upon monitoring results quite a difficult work to be done. Simulations of short circuits deterministically predict their behavior in various types and situations of possible short circuits. The results of these simulations are used to make up a database whose information can be dealt with stochastically. This allows a faster inference of the measure of voltage sag occurrences. This article describes the methodology of stochastic estimate of the quantity and characteristics of voltage sags, which may affect a range of consumers. An example is used to demonstrate the application of the methodology and its results are presented herein.
Keywords :
power supply quality; power system parameter estimation; power system simulation; short-circuit currents; stochastic processes; database; electromagnetic phenomenon; inference; probabilistic nature; short circuits simulation; voltage sag measurement; voltage sag stochastic estimate; Circuit faults; Circuit simulation; Electrical capacitance tomography; Fault location; Radio access networks; Relational databases; Stochastic processes; Stochastic systems; Transmission lines; Voltage fluctuations;
Conference_Titel :
Industry Applications Conference, 2001. Thirty-Sixth IAS Annual Meeting. Conference Record of the 2001 IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-7114-3
DOI :
10.1109/IAS.2001.955757