• DocumentCode
    1620549
  • Title

    9-valued 2-dimensional parallel switch level fault simulation

  • Author

    Ryan, Christopher A. ; Tront, Joseph G.

  • Author_Institution
    Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • fYear
    1992
  • Firstpage
    348
  • Abstract
    Switch level fault simulation increases accuracy over gate level fault simulation at the cost of increased complexity. A two-dimensional extension to parallel fault simulation for the switch level is presented. Using 9-valued logic and a parallel hardware accelerated fault simulator, simulation complexity is reduced to O(L**2), where L is the number of levels of switches encountered when traversing from output to input
  • Keywords
    circuit analysis computing; logic CAD; logic testing; many-valued logics; 9-valued logic; parallel fault simulation; parallel hardware accelerated fault simulator; simulation complexity; switch level fault simulation; two-dimensional extension; Acceleration; Circuit faults; Circuit simulation; Computational modeling; Degradation; Hardware; Logic; Switches; Switching circuits; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-0510-8
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1992.271289
  • Filename
    271289