Title :
Techniques for improved testability in the IBM ES/9370 system
Author :
Lusch, Robert F. ; Sarkany, Endre F.
Author_Institution :
IBM Corp., Endicott, NY, USA
Abstract :
The authors discuss three techniques used in the IBM ES/9370 series of processors to improve the testability, and hence the quality levels, of card assemblies. First they investigate the testing requirements and challenges presented by a nonvolatile static RAM and how they were met. Then they introduce a method which uses flush-through logic to provide improved access to array components. Next, the authors discuss how a compare circuit can be used to reduce I/O (input/output) requirements when testing an array. These algorithms were successfully implemented using programming Language for Testing (PLT). Background information and a detailed methodology for each of the techniques are provided
Keywords :
IBM computers; automatic testing; high level languages; integrated circuit testing; integrated memory circuits; logic arrays; logic testing; printed circuit testing; random-access storage; IBM ES/9370; IC testing; PC testing; array; card assemblies; computer equipment testing; flush-through logic; input/output; logic testing; nonvolatile static RAM; programming Language for Testing; quality; testability; Automatic testing; Circuit testing; EPROM; Logic arrays; Logic design; Logic testing; Nonvolatile memory; Read-write memory; System testing; Timing;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82310
