Title :
An experiment for radial temperature profile measurements in a microwave induced plasma at atmospheric pressure
Author :
Borras, M.C. ; Hadidi, Khayrollah ; Woskov, P. ; Thomas, Paul
Author_Institution :
MIT, MA, USA
Abstract :
summary form only given. A microwave induced plasma device is being developed for sensitive continuous emission monitoring of trace metals in furnace exhausts using atomic emission spectroscopy. The plasma is created in air at atmospheric pressure, and maintained by a 1.5 kW, 2.45 GHz microwave source. A diagnostic system, consisting of a fiber optic cable, lenses, a spectrometer, and a linear Si diode detector array, provides information about the light emitted from the plasma with a maximum resolution of 0.01 nm in the range of 190-600 nm. In this work we describe the experimental setup for the temperature profile reconstruction, the conceptual method for data analysis and some preliminary results.
Keywords :
air pollution measurement; microwave devices; plasma devices; plasma diagnostics; plasma pressure; plasma temperature; spectral methods of temperature measurement; 1.5 kW; 190 to 600 nm; 2.45 GHz; atmospheric pressure; atomic emission spectroscopy; data analysis; diagnostic system; fiber optic cable; furnace exhausts; lenses; light emission; linear Si diode detector array; microwave induced plasma; microwave source; plasma creation; radial temperature profile measurements; sensitive continuous emission monitoring; temperature profile reconstruction; trace metals; Atmospheric-pressure plasmas; Microwave devices; Optical arrays; Plasma devices; Plasma diagnostics; Plasma measurements; Plasma sources; Plasma temperature; Spectroscopy; Temperature measurement;
Conference_Titel :
Plasma Science, 1998. 25th Anniversary. IEEE Conference Record - Abstracts. 1998 IEEE International on
Conference_Location :
Raleigh, NC, USA
Print_ISBN :
0-7803-4792-7
DOI :
10.1109/PLASMA.1998.677632
