DocumentCode :
1625544
Title :
Analysis of Contact Resistance Data with Weibull Distribution Function
Author :
Hasegawa, Makoto ; Yanagitani, Yuta
Author_Institution :
Dept. of Appl. Photonics Syst. Technol., Chitose Inst. of Sci. & Technol., Chitose
fYear :
2008
Firstpage :
344
Lastpage :
349
Abstract :
In order to realize detailed analysis of measured contact resistance data, fitting of Weibull distribution function to contact resistance data is being tried. For that purpose, the original Weibull fitting software has been prepared, and applied to some sets of the measured data. When successful fitting results are obtained, an average value of the contact resistance data can be replaced with the sum of two Weibull parameters, i.e., the location parameter Ro and the scale parameter Ra. However, more revisions to the fitting algorithm are still required for realizing further study of contact resistance characteristics through the Weibull fitting analysis.
Keywords :
Weibull distribution; contact resistance; Weibull distribution function; Weibull fitting software; contact resistance data; location parameter Ro; scale parameter Ra; Arc discharges; Contact resistance; Electrical resistance measurement; Mechanical variables measurement; Partial discharges; Software measurement; Surface discharges; Surface fitting; Surface resistance; Weibull distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 2008. Proceedings of the 54th IEEE Holm Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1901-2
Electronic_ISBN :
978-1-4244-1902-9
Type :
conf
DOI :
10.1109/HOLM.2008.ECP.66
Filename :
4694967
Link To Document :
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