Title :
Evaluation of an efficient control-oriented coverage metric
Author :
Ramineni, Kiran ; Verma, Shireesh ; Harris, Ian G.
Author_Institution :
Center for Embedded Comput. Syst., Univ. of California, Irvine, Irvine, CA
Abstract :
Dynamic verification, the use of simulation to determine design correctness, is widely used due to its tractability for large designs. A serious limitation of dynamic techniques is the difficulty in determining whether or not a test sequence is sufficient to detect all likely design errors. Coverage metrics are used to address this problem by providing a set of goals to be achieved during the simulation process; if all coverage goals are satisfied then the test sequence is assumed to be complete. Many coverage metrics have been proposed but no effort has been made to identify a correlation between existing metrics and design quality. In this paper we present a technique to evaluate a coverage metric by examining its ability to ensure the detection of real design errors. We apply our evaluation technique to our control-oriented coverage metric to verify its ability to reveal design errors.
Keywords :
formal verification; software metrics; control-oriented coverage metric; dynamic verification; test sequence; Benchmark testing; Computational modeling; Computer simulation; Embedded computing; Error correction; Fault detection; Formal verification; Hardware design languages; Performance evaluation; Process design;
Conference_Titel :
High Level Design Validation and Test Workshop, 2008. HLDVT '08. IEEE International
Conference_Location :
Incline Village, NV
Print_ISBN :
978-1-4244-2922-6
DOI :
10.1109/HLDVT.2008.4695895