• DocumentCode
    1627993
  • Title

    Time-Of-Flight range finding sensor using an integrated PNP PIN Phototransistor in 180 nm CMOS

  • Author

    Davidovic, Milos ; Kostov, Plamen ; Hofbauer, Michael ; Gaberl, Wolfgang ; Zimmermann, Horst

  • Author_Institution
    Inst. of Electrodynamics, Microwave & Circuit Eng., Vienna Univ. of Technol., Vienna, Austria
  • fYear
    2012
  • Firstpage
    258
  • Lastpage
    260
  • Abstract
    In this work we present the first approach of a Time-Of-Flight (TOF) sensor with an integrated bandwidth enhanced pnp phototransistor. The pixel reaches a fill factor of 67 %. A standard 180 nm CMOS process was used for implementing the TOF sensor together with the phototransistor. Both were combined to an optoelectronic integrated circuit. The power consumption of the sensor was 900 nW. Standard deviations of the measured distances well better than 5.1 cm were achieved for realistic optical powers in the range of nW. For the optimal working point of the phototransistor at around 100 nW a standard deviation of only 1.6 mm was measured.
  • Keywords
    CMOS integrated circuits; integrated optoelectronics; p-i-n photodiodes; phototransistors; CMOS process; PIN phototransistor; enhanced pnp phototransistor; integrated PNP; integrated bandwidth; optimal working point; optoelectronic integrated circuit; power 900 nW; time-of-flight range finding sensor; wavelength 180 nm; Optical attenuators; Optical fiber sensors; Optical saturation; Optical variables measurement; Phototransistors; Standards; PIN; Phototransistor; TOF sensor; depth sensor; distance measurement; time of flight;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Group IV Photonics (GFP), 2012 IEEE 9th International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1949-2081
  • Print_ISBN
    978-1-4577-0826-8
  • Type

    conf

  • DOI
    10.1109/GROUP4.2012.6324152
  • Filename
    6324152