Title :
Modeling, analysis, simulation and control of semiconductor manufacturing systems: a generalized stochastic colored timed Petri net approach
Author :
Lin, Yuji ; Fu, Li-Chen
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fDate :
6/21/1905 12:00:00 AM
Abstract :
A generalized stochastic colored timed Petri net (GSCTPN) is used to model an IC wafer fabrication system. There are two major sub-models: a process flow model and transportation model. There are two different automated guided vehicle systems, namely, the interbay system and intrabay system. For multiple-load and variable-speed AGV systems, we embed a simple motion-planning rule and introduce a collision avoidance strategy in the model to solve the variable speed and traffic jam problems of vehicles. The simple control policies for AGV visiting and AGV routing are discussed. The heuristic rules for lot release and lot scheduling are also studied. To obtain performance measures, simulation is used. To show the promising potential of the proposed work, a real-word IC wafer fabrication system is used as a target plant layout for implementation
Keywords :
Petri nets; automatic guided vehicles; collision avoidance; digital simulation; graph colouring; heuristic programming; industrial control; scheduling; semiconductor device manufacture; IC wafer fabrication system; automated guided vehicle; collision avoidance; generalized stochastic colored timed Petri net; heuristic rules; interbay system; intrabay system; lot release; lot scheduling; modeling; motion planning; process flow model; semiconductor manufacturing systems; simulation; transportation model; variable-speed AGV; Analytical models; Automatic control; Collision avoidance; Fabrication; Integrated circuit modeling; Motion-planning; Semiconductor device modeling; Stochastic systems; Transportation; Vehicles;
Conference_Titel :
Systems, Man, and Cybernetics, 1999. IEEE SMC '99 Conference Proceedings. 1999 IEEE International Conference on
Conference_Location :
Tokyo
Print_ISBN :
0-7803-5731-0
DOI :
10.1109/ICSMC.1999.823325