DocumentCode :
1628365
Title :
Study of Statistical Electromagnetics and Modeling of Surrogate IED Blasting Caps
Author :
Lambrecht, Michael R. ; Baum, Carl ; Gaudet, John ; Christodoulou, Christos ; Schamiloglu, Edl
Author_Institution :
Univ. of New Mexico, Albuquerque
fYear :
2007
Firstpage :
743
Lastpage :
743
Abstract :
Summary form only given. Preliminary research is being conducted to facilitate the development of a system for remotely detonating an IED using directed microwave energy. A detailed understanding of the coupling of electromagnetic energy into the blasting cap of an IED must first be established in order to analyze the interaction of coupled energy with components and materials located within the cap. This analysis will include analytic as well as numerical modeling of a blasting cap along with impedance measurements and experimental validation of its electromagnetic properties. The presence of IED´s within enclosures and other complicated environments will require additional system analysis using statistical electromagnetics. The statistical examination will be used to determine the probability of sufficient electromagnetic energy being present near critical components, such as the blasting cap, to detonate a device.
Keywords :
computational electromagnetics; microwave measurement; numerical analysis; blasting cap; coupled energy; electromagnetic energy; electromagnetic properties; impedance measurements; microwave energy; numerical modeling; statistical electromagnetics; surrogate IED blasting caps; Conducting materials; Electromagnetic analysis; Electromagnetic coupling; Electromagnetic devices; Electromagnetic modeling; Impedance measurement; Numerical models; Power engineering and energy; Probability; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
Conference_Location :
Albuquerque, NM
ISSN :
0730-9244
Print_ISBN :
978-1-4244-0915-0
Type :
conf
DOI :
10.1109/PPPS.2007.4346049
Filename :
4346049
Link To Document :
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