DocumentCode
1629308
Title
Improve variability in carbon nanotube FETs by scaling
Author
Sun, Yanning ; Tuleski, George ; Han, Shu-Jen ; Haensch, Wilfried ; Chen, Zhihong
Author_Institution
IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
2010
Firstpage
283
Lastpage
284
Abstract
Carbon nanotube transistors are shown to have large performance variation due to their diameter variation, which is not acceptable to VLSI technology. We demonstrate that by proper scaling we can reach >2 mA/μm on-state current in 90% of our nanotube devices. More importantly, we demonstrate proper scaling can reduce the current variation by 2 orders of magnitude and mitigate the impact of tube diameter distribution.
Keywords
VLSI; carbon nanotubes; field effect transistors; nanotube devices; VLSI technology; carbon nanotube FET; carbon nanotube transistors; field-effect transistors; nanotube devices; tube diameter distribution; CNTFETs; Logic gates; Nanoscale devices; Nanotubes;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2010
Conference_Location
South Bend, IN
ISSN
1548-3770
Print_ISBN
978-1-4244-6562-0
Electronic_ISBN
1548-3770
Type
conf
DOI
10.1109/DRC.2010.5551959
Filename
5551959
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