DocumentCode :
1630043
Title :
On modeling variations for face authentication
Author :
Liu, Xiaoming ; Chen, Tsuhan ; Kumar, B. V K Vijaya
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
2002
Firstpage :
384
Lastpage :
389
Abstract :
We present a scheme for face authentication in the presence of variations. To deal with variations, such as facial expressions and registration errors, with which traditional appearance-based methods do not perform well, we propose the eigenflow approach. In this approach, the optical flow and the optical flow residue between a test image and a training image are computed first. The optical flow is then fitted to a model that is pre-trained by applying principal component analysis (PCA) to optical flows resulting from variations caused by facial expressions and registration errors. The eigenflow residue, optimally combined with the optical flow residue using linear discriminant analysis (LDA), determines the authenticity of the test image. Experimental results show that the proposed scheme outperforms the traditional methods in the presence of expression variations and registration errors. The approach can be extended to model lighting and pose variations as well.
Keywords :
eigenvalues and eigenfunctions; face recognition; image registration; image sequences; principal component analysis; appearance-based methods; eigenflow approach; eigenvectors; experimental results; face authentication; facial expressions; human face recognition; image registration errors; linear discriminant analysis; model lighting; modeling variations; optical flow; pose variations; principal component analysis; training image; Authentication; Electrical capacitance tomography; Face recognition; Humans; Image motion analysis; Optical devices; Optical sensors; Principal component analysis; Reactive power; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automatic Face and Gesture Recognition, 2002. Proceedings. Fifth IEEE International Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7695-1602-5
Type :
conf
DOI :
10.1109/AFGR.2002.1004184
Filename :
1004184
Link To Document :
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