DocumentCode :
1630524
Title :
Data mapping for unreliable memories
Author :
Roth, Christian ; Benkeser, Christian ; Studer, Christoph ; Karakonstantis, Georgios ; Burg, Andreas
Author_Institution :
Dept. of Inf. Technol. & Electr. Eng., ETH Zurich, Zürich, Switzerland
fYear :
2012
Firstpage :
679
Lastpage :
685
Abstract :
Future digital signal processing (DSP) systems must provide robustness on algorithm and application level to the presence of reliability issues that come along with corresponding implementations in modern semiconductor process technologies. In this paper, we address this issue by investigating the impact of unreliable memories on general DSP systems. In particular, we propose a novel framework to characterize the effects of unreliable memories, which enables us to devise novel methods to mitigate the associated performance loss. We propose to deploy specifically designed data representations, which have the capability of substantially improving the system reliability compared to that realized by conventional data representations used in digital integrated circuits, such as 2´s-complement or sign-magnitude number formats. To demonstrate the efficacy of the proposed framework, we analyze the impact of unreliable memories on coded communication systems, and we show that the deployment of optimized data representations substantially improves the error-rate performance of such systems.
Keywords :
data structures; digital integrated circuits; reliability; semiconductor technology; signal processing; DSP systems; coded communication systems; data mapping; digital integrated circuits; digital signal processing; error-rate performance; optimized data representations; reliability issues; semiconductor process technologies; system reliability; unreliable memories; Circuit faults; Communication systems; Digital signal processing; Integrated circuit modeling; Robustness; Signal to noise ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communication, Control, and Computing (Allerton), 2012 50th Annual Allerton Conference on
Conference_Location :
Monticello, IL
Print_ISBN :
978-1-4673-4537-8
Type :
conf
DOI :
10.1109/Allerton.2012.6483283
Filename :
6483283
Link To Document :
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