Title :
Issues for mixed-signal CAD-tester interface
Abstract :
It has sometimes been assumed that mixed-signal-device test development automation would be a straightforward extension of the technology used with purely digital designs. The author explores the nature of mixed-signal testing and of the device design and test design processes. The test development automation process is put into clearer focus, with attention given to consequences for design CAD/CAE (computer-aided design and engineering) tools, as well as for test development tools
Keywords :
CAD/CAM; automatic test equipment; circuit CAD; electronic engineering computing; CAD-tester interface; CAD/CAE; mixed-signal testing; test development tools; Automatic testing; Circuit simulation; Circuit testing; Control systems; Design automation; Hardware; Instruments; Process design; System testing; Timing;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82344
