Title :
Trends in CAD/CAP FOR VLSI
Author_Institution :
Intel Israel, Ltd., Israel
Keywords :
Acceleration; Circuit analysis; Circuit simulation; Circuit synthesis; Circuit testing; Design automation; Design methodology; Hardware design languages; Very large scale integration;
Conference_Titel :
Electrical and Electronics Engineers in Israel, 1989. The Sixteenth Conference of
Conference_Location :
Tel-Aviv, Israel
DOI :
10.1109/EEIS.1989.720127
