DocumentCode :
1633157
Title :
Dynamically configurable pHEMT model using neural networks for CAD
Author :
Davis, B. ; White, C. ; Reece, M.A. ; Bayne, M.E., Jr. ; Thompson, W.L., II ; Richardson, N.L. ; Walker, L., Jr.
Author_Institution :
Center of Microwave RF & Satellite Eng., Morgan State Univ., Baltimore, MD, USA
Volume :
1
fYear :
2003
Firstpage :
177
Abstract :
A novel approach to developing CAD microwave device models is presented. Traditional CAD devices are implemented using static empirical equations to describe electrical behavior. Recently, neural networks have been used in place of empirical equations to model device behavior. This paper describes the implementation of a CAD device model that utilizes a dynamically configurable combination of empirical equations and neural networks to increase the flexibility of the model´s capabilities. The model was developed for pHEMT devices but can be customized to work with other device structures such as HBTs. The framework for this model is a common-source large-signal equivalent FET circuit. With the exception of the drain current source, all of the nonlinear elements of the circuit are configurable to either empirical or bias-dependent neural network controlled components. The neural network architecture employed is based on the knowledge-based algorithm.
Keywords :
circuit CAD; equivalent circuits; high electron mobility transistors; microwave field effect transistors; neural nets; semiconductor device models; CAD microwave device models; HBTs; common-source equivalent circuit; dynamically configurable pHEMT model; equivalent FET circuit; knowledge-based algorithm; large-signal equivalent circuit; microwave CAD; neural networks; pHEMT devices; Design automation; FET circuits; Microwave devices; Neural networks; Nonlinear equations; Optimized production technology; PHEMTs; Radio frequency; Satellites; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-7695-1
Type :
conf
DOI :
10.1109/MWSYM.2003.1210910
Filename :
1210910
Link To Document :
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