• DocumentCode
    163585
  • Title

    A comparative investigation on <0001> direction and <11–20> direction 4H-SiC impact avalanche transit time devices working at D-band frequencies

  • Author

    Qing Chen ; Lin´an Yang ; Yang Dai ; Yue Hao

  • Author_Institution
    State Key Discipline Lab. of Wide Bandgap Semicond. Technol., Xidian Univ., Xi´an, China
  • fYear
    2014
  • fDate
    18-20 May 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We report on a numerical simulation on <;0001> direction and <;11-20> direction p+/n/n-/n+ (single drift region) 4H silicon carbide (4H-SiC) Impact-Ionization-Avalanche-Transit-Time (IMPATT) diodes for operation at D-band frequencies. Results show that the output performance of 4H-SiC IMPATT diode is sensitive to the crystal direction of the one-dimensional current flow. The <;0001> direction 4H-SiC IMPATT diode exhibits larger breakdown voltage and higher de-to-rf conversion efficiency (η) due to its lower electron and hole ionization rates and higher ratio of drift zone voltage drop (VD) to breakdown voltage (VB) compared with those for <;11-20> direction 4H-SiC IMPATT diode. Higher dc-to-rf conversion efficiency and larger breakdown voltage in <;0001> direction 4H-SiC IMPATT diode imply its millimeter wave power output higher than <;11-20> direction 4H-SiC IMPATT diode.
  • Keywords
    IMPATT diodes; numerical analysis; silicon compounds; wide band gap semiconductors; IMPATT diodes; SiC; breakdown voltage; dc-to-rf conversion efficiency; drift zone voltage drop; hole ionization rates; impact avalanche transit time devices; impact-ionization-avalanche-transit-time diodes; lower electron rates; numerical simulation; one-dimensional current flow; Charge carrier processes; Integrated circuit modeling; Ionization; Materials; Radio frequency; Semiconductor diodes; Silicon carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Junction Technology (IWJT), 2014 International Workshop on
  • Conference_Location
    Shanghai
  • Type

    conf

  • DOI
    10.1109/IWJT.2014.6842037
  • Filename
    6842037