• DocumentCode
    1636286
  • Title

    Influence of switching regimes on dielectric strength of high current triggered vacuum switches

  • Author

    Sidorov, V.A. ; Alferov, Dmitry F. ; Korobova, N.I.

  • Author_Institution
    Electrotech. Inst., Moscow, Russia
  • Volume
    2
  • fYear
    1999
  • Firstpage
    1254
  • Abstract
    Switching conditions influence on dielectric strength of internal insulation of high-current triggered vacuum switches with trapezoidal-rod electrode system is investigated. Investigations were carried out for two switching regimes. In the first regime electrode erosion occurs mainly in a vapor phase where the electrode surface remains smooth after switching. In the other switching regime a drop phase of electrode erosion prevails and considerable electrode surface damage takes place. It follows from statistical processing of experimental data that the breakdown voltage distribution is described with a Weibull distribution law satisfactorily. Influence of gap and electrode material on dielectric strength of triggered vacuum switches is considered.
  • Keywords
    Weibull distribution; electric strength; electrodes; switching; vacuum switches; Weibull distribution law; breakdown voltage distribution; dielectric strength; drop phase; electrode erosion; electrode surface; electrode surface damage; high current triggered vacuum switches; internal insulation; statistical processing; switching regime; switching regimes; trapezoidal-rod electrode; triggered vacuum switches; vapor phase; Capacitors; Copper; Dielectric breakdown; Dielectric measurements; Electrodes; Switches; Testing; Vacuum arcs; Vacuum breakdown; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 1999. Digest of Technical Papers. 12th IEEE International
  • Conference_Location
    Monterey, CA, USA
  • Print_ISBN
    0-7803-5498-2
  • Type

    conf

  • DOI
    10.1109/PPC.1999.823752
  • Filename
    823752