DocumentCode :
1636757
Title :
Charging characteristics of Sb nanocrystals embedded in copper phthalocyanine films for memory applications
Author :
Huang, Yue ; Ding, Shi-Jin ; Zahn, Dietrich R T
Author_Institution :
Dept. of Microelectron., Fudan Univ., Shanghai, China
fYear :
2010
Firstpage :
1289
Lastpage :
1291
Abstract :
The charging characteristics of Sb nanocrystals embedded in organic semiconductor copper phthalocyanine (CuPc) have been studied for the first time. The images from atomic force microscopy show that Sb NCs grown on the surface of CuPc film exhibit a vertical height of 10-15 nm and uniform distribution, which are interspersed with a few bigger ones (~30 nm). Two kinds of capacitance-voltage measurements, frequency responds and hysteresis loops, of the control sample and the one embedded with Sb NCs indicate the charging and discharging of the Sb NCs.
Keywords :
antimony; atomic force microscopy; capacitance measurement; organic semiconductors; semiconductor storage; voltage measurement; Sb; atomic force microscopy; capacitance-voltage measurement; charging characteristics; frequency response; hysteresis loop; memory application; nanocrystals; organic semiconductor copper phthalocyanine film; Capacitance-voltage characteristics; Films; Frequency measurement; Hysteresis; Metals; Nanocrystals; Organic materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5797-7
Type :
conf
DOI :
10.1109/ICSICT.2010.5667640
Filename :
5667640
Link To Document :
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