DocumentCode :
1636980
Title :
Understanding HALT application in desktop, NB and Server
Author :
Hsu, Alvin ; Huang, Danny LS ; Chang, Gerald ; Yang, Jimmy
Author_Institution :
Wistron Corp., Hsinchu, Taiwan
fYear :
2012
Firstpage :
1
Lastpage :
6
Abstract :
Application of HALT at design stage becomes more and more common in electronics industry. Many discussions and disputations of the HALT test interpretation are in full swing. With our HALT test experiences in notebook, desktop and server products, we intend to share and discuss the safety factor of exact product operating limits to its operation specifications in temperature and vibration and common failure modes stimulated thereby. A general perspective of the test setup techniques by product types and its influence is also provided. The distinctive roles of HALT on board level and system level from thermal flow field point of view are also shared in this paper.
Keywords :
life testing; reliability; HALT application; HALT test experience; HALT test interpretation; board level; desktop; electronics industry; highly accelerated life testing; safety factor; server products; system level; thermal flow; Niobium; Reliability engineering; Servers; Stress; Thermal stresses; Vibrations; Design Margin; Flow Field; HALT; Highly Accelerated Life Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2012 Proceedings - Annual
Conference_Location :
Reno, NV
ISSN :
0149-144X
Print_ISBN :
978-1-4577-1849-6
Type :
conf
DOI :
10.1109/RAMS.2012.6175460
Filename :
6175460
Link To Document :
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