Title :
A high-voltage ATE pin driver
Author_Institution :
Elantec, Inc., Milpitas, CA, USA
Abstract :
The author describes a pin driver for automatic test equipment. The goals of this pin driver design were greater than 20 V of output swing, a 1-V/ns edge rate, and ruggedness in its intended industrial environment while using an economical integrated process. Delay and tristate times were 3 and 6 ns, respectively, and delay dispersion was typically 250 ps. The device was constructed with a complementary bipolar process utilizing dielectric isolation, and was extremely rugged
Keywords :
automatic test equipment; bipolar integrated circuits; driver circuits; pulse generators; 20 V; 3 ns; 6 ns; ATE pin driver; HV driver IC; automatic test equipment; complementary bipolar process; dielectric isolation; high-voltage; Automatic testing; Bridge circuits; Delay; Driver circuits; Electronic equipment testing; Environmental economics; Logic; Schottky diodes; System testing; Voltage;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 1992., Proceedings of the 1992
Conference_Location :
Minneapolis, MN
Print_ISBN :
0-7803-0727-5
DOI :
10.1109/BIPOL.1992.274043
