Title :
A 14ns 1mb Cmos Sram With Variable Bit-organization
Author :
Wada, T. ; Anami, K. ; Kawai, Y. ; Yuzuriha, K. ; Kohno, Y. ; Matsukawa, T. ; Kayano, S.
Author_Institution :
Mitsubishi Electric Corp., Itami, Japan
Keywords :
Circuit testing; Decoding; Delay effects; Delay lines; Driver circuits; Inverters; Pulse amplifiers; Random access memory; Read-write memory; Solid state circuits;
Conference_Titel :
Solid-State Circuits Conference, 1988. Digest of Technical Papers. ISSCC. 1988 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1988.663715
