Title :
A military test method for measuring fault coverage
Author :
Debany, Warren H., Jr.
Author_Institution :
US Air Force Rome Air Dev. Center, Griffiss AFB, NY, USA
Abstract :
Proposed MIL-STD-883 Test Procedure 5012, `Fault Coverage Measurement for Digital Microcircuits´, is described. Numerous fault simulation tools are commercially available; this procedure provides a means of obtaining consistent and repeatable fault coverage values from different fault simulators. The procedure describes requirements governing the development of the logic model for the IC, the assumed fault model and fault universe, fault classing, fault simulation, and fault coverage reporting. It provides a consistent means of reporting fault coverage for an IC regardless of the specific logic and fault simulator used
Keywords :
automatic testing; digital integrated circuits; digital simulation; fault location; logic testing; measurement standards; military equipment; MIL-STD-883 Test Procedure 5012; digital microcircuits; fault classing; fault coverage; fault model; fault simulation tools; fault universe; logic model; military test; Circuit faults; Circuit simulation; Circuit testing; Integrated circuit manufacture; Integrated circuit modeling; Integrated circuit testing; Logic testing; Manufacturing; Programmable logic arrays; Qualifications;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82402
