DocumentCode :
1640741
Title :
Issues in validating package compact thermal models for natural convection cooled electronic systems
Author :
Adams, V.H. ; Blackburn, D.L. ; Joshi, Y. ; Berning, D.W.
Author_Institution :
Dept. of Mech. Eng., Maryland Univ., College Park, MD, USA
fYear :
1997
Firstpage :
10
Lastpage :
23
Abstract :
A methodology is proposed for the validation of compact thermal models of electronic packages which utilizes data and simulations obtained from a simple but realistic system containing the package. The test system is the enclosure specified by the JEDEC Subcommittee, JC15.1 for thermal measurements in a natural convection environment. Simulations for a detailed model and several different compact models for a 88-pin plastic quad flat-package in the enclosure are in good agreement with experimental measurements of junction temperature. The study shows that the system must be well characterized, including accurate knowledge of circuit board thermal conductivity and accurate simulation of radiation heat transfer, to serve for validation purposes. For the package used in this study, system level considerations can outweigh package level considerations for predicting junction temperature. Given that the system is accurately modeled, the JEDEC enclosure can serve as a viable experimental validation tool for compact models
Keywords :
cooling; natural convection; plastic packaging; JEDEC enclosure; circuit board thermal conductivity; compact thermal model validation; electronic package; junction temperature; natural convection cooling; plastic quad flat-package; radiation heat transfer simulation; thermal measurement; Circuit simulation; Computational fluid dynamics; Computational modeling; Electronic packaging thermal management; Heat transfer; Predictive models; Semiconductor device packaging; Surface resistance; Temperature; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1997. SEMI-THERM XIII., Thirteenth Annual IEEE
Conference_Location :
Austin, TX
ISSN :
1065-2221
Print_ISBN :
0-7803-3793-X
Type :
conf
DOI :
10.1109/STHERM.1997.566778
Filename :
566778
Link To Document :
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