Title :
A transistor matching technology improving effectively DC resolution of current-steering DAC
Author :
Luo, Pu ; Yang, Weidong ; Fu, Dongbing ; Yu, Jinshan
Author_Institution :
Nat. Labs. of Analog Integrated Circuits, Chongqing, China
Abstract :
The requirements of segmented current-steering DAC´s MSB part for transistor matching are very high. In this paper, a diagonal layout is presented which can meet very well the requirements of 12-bit DAC monotonicity. The DAC was developed in TSMC 0.18um process technology. As a result of measurements, the static errors are: DNL=±0.15LSB, and INL=±0.2LSB.
Keywords :
digital-analogue conversion; transistors; DC resolution; MSB; TSMC; diagonal layout; segmented current-steering DAC; size 0.18 mum; transistor matching technology; word length 12 bit; Current measurement; Fluctuations; Layout; MOSFETs; Systematics; Temperature measurement;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5797-7
DOI :
10.1109/ICSICT.2010.5667788
