DocumentCode :
1642659
Title :
Electrostatic discharge (ESD) testing of semiconductor chips and systems - paradigm shifts, and semiconductor industry consequences
Author :
Voldman, Steven H.
Author_Institution :
ESD Assoc., Burlington, VT, USA
fYear :
2010
Firstpage :
54
Lastpage :
57
Abstract :
Dramatic changes and paradigm shifts are presently occurring in the area of electrostatic discharge (ESD) testing of semiconductor chips and systems which may have significant influence on the semiconductor industry. New semiconductor chip tests that have traditionally been regarded as system level events are now being proposed as requirements on semiconductor chips. As these changes are occurring, the consequences on the semiconductor industry, semiconductor chips, and systems are still to be understood in the future.
Keywords :
electrostatic discharge; semiconductor device testing; semiconductor industry; ESD testing; electrostatic discharge testing; paradigm shifts; semiconductor chip tests; semiconductor industry consequences; Discharges; Electromagnetic compatibility; Electrostatic discharge; Humans; Manufacturing; Standards; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5797-7
Type :
conf
DOI :
10.1109/ICSICT.2010.5667853
Filename :
5667853
Link To Document :
بازگشت