• DocumentCode
    1644709
  • Title

    Multi-line TRL calibration compared to a general de-embedding method

  • Author

    Ferndahl, Mattias ; Andersson, Kristoffer ; Fager, Christian

  • Author_Institution
    Microwave Electron. Lab., Chalmers Univ. of Technol., Goteborg, Sweden
  • fYear
    2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    A direct comparison between a newly proposed general equivalent-circuit-based de-embedding method and a multi-line TRL calibration is presented. It is shown that the de-embedding method yields corrected/ intrinsic S-parameters with good accuracy when compared to the calibration, even up to 100 GHz hence, validating the de-embedding method. Furthermore, in the de-embedding, different equivalent-circuit models with varying complexity for the embedding network are compared and evaluated.
  • Keywords
    S-parameters; calibration; equivalent circuits; lumped parameter networks; microwave measurement; transistors; S-parameters; general de-embedding method; multi-line TRL calibration; Calibration; Frequency estimation; Impedance; Joining processes; Laboratories; Microwave theory and techniques; Packaging; Probes; Radio frequency; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Conference, 2009 73rd ARFTG
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-3442-8
  • Electronic_ISBN
    978-1-4244-3443-5
  • Type

    conf

  • DOI
    10.1109/ARFTG.2009.5278070
  • Filename
    5278070