Modeling and prediction of conducted EMI noise in a 2-stage interleaved boost DC/DC converter

Conducted electromagnetic interference (EMI) noise for a 2-stage interleaved DC/DC boost converter is investigated in this paper. Both differential mode (DM) noise and common mode (CM) noise are studied, taking into account all parasitic components. Using frequency domain approach, a noise prediction model for the interleaved topology is developed. The results from the model are compared with those of the non-interleaved topology to characterize the conducted EMI noise caused by doubling the number of high frequency power switches and switching frequency reduction in the interleaved topology. It is shown that the magnitude of the DM and CM noise in the interleaved topology is less than in the non-interleaved topology, especially at high frequencies in the spectrum of the conducted noise.