1646842

Functional and scan tests: The effectiveness of I/sub DDQ/ how many fault coverages do we need?

Maxwell, P.C. ; Inshen Chiang

1995

168

Circuit faults; Circuit testing; Condition monitoring; Delay; Extrapolation; Fault detection; Integrated circuit testing; Power supplies; Production; Timing;

English

ieee

Test Conference, 1992. Proceedings., International

Baltimore, MD

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527817

527817