Title :
High-responsivity InGaAs/InP photodetectors integrated on silicon-on-insulator waveguide circuits
Author :
Dongdong Yin ; Qin Han ; Weihong Yin ; Peng Feng ; Qianqian, L.V. ; Xiaohong Yang
Author_Institution :
State Key Lab. on Integrated Optoelectron., Inst. of Semicond., Beijing, China
Abstract :
This paper presents a high responsivity InGaAs / InP PIN photodetector bonded on silicon-on-insulator (SOI) waveguide circuit with a Si waveguide width of 2000 nm. Divinyltetramethyldisiloxane-benzocyclobutene (DVS-BCB) is used to integrate the InGaAs/InP film epitaxial layers onto the silicon waveguide wafer. A grating coupler is adopted to couple light from the fiber to the Si waveguide. Light in the Si photonic waveguide is evanescently coupled into the InP ridge waveguide and can finally be absorbed in the absorption layer. The simulation results show that the detection efficiency can reach 95%. The measured detector responsivity is 0.87 A/W (excluding the coupling loss between the fiber and the grating coupler and the silicon propagation loss) at a wavelength of 1550nm and a bias voltage of -3V.
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; integrated optics; optical fibre couplers; optical fibre losses; optical waveguides; photodetectors; ridge waveguides; semiconductor epitaxial layers; silicon-on-insulator; InGaAs-InP; Si; bias voltage; coupling loss; detection efficiency; divinyltetramethyldisiloxane-benzocyclobutene; epitaxial layers; grating coupler; high-responsivity photodetectors; ridge waveguide; silicon propagation loss; silicon-on-insulator waveguide circuits; size 2000 nm; voltage -3 V; wavelength 1550 nm; III-V semiconductor materials; Indium phosphide; Loss measurement; Optical device fabrication; Optical waveguides; Photodetectors; Silicon; Photodetector; SOI; coupling; efficiency; evanescent wave;
Conference_Titel :
Optical Communications and Networks (ICOCN), 2015 14th International Conference on
Conference_Location :
Nanjing
DOI :
10.1109/ICOCN.2015.7203674