Title :
Thermal management in PowerPC microprocessor multichip modules applications
Author :
Yuan, Tsorng-Dih
Author_Institution :
Microelectron. Div., IBM Corp., Hopewell Junction, NY, USA
Abstract :
Thermal management considerations of PowerPC microprocessor multichip modules are discussed in this paper. Flow bypass effects on both PowerPC 603 and PowerPC 604 MCM heat sink and module thermal performance were quantified by computational fluid dynamics and conjugate conduction analysis. In PowerPC 603 MCM application, the heat sink thermal resistance can vary as large as 80% due to such effects, while in PowerPC 604 MCM application, the variation in thermal resistance can be as large as 100%. The conjugate heat transfer features in both PowerPC 603 and PowerPC 604 MCM were examined. Results show that the percentage of module power entering into the heat sink seems quite independent of the module component thermal properties. In general, about 70% of the module heat enters into the heat sink for PowerPC 603 MCM and about 85% of the module heat enters into the heat sink for PowerPC 504 MCM. Both module thermal resistances and the percentage of chip and module power distributions are affected by those material properties. Their effects were studied to understand the MCM thermal characteristics and to define the critical design parameters for thermal performance optimization
Keywords :
cooling; heat sinks; integrated circuit design; integrated circuit packaging; microprocessor chips; multichip modules; thermal resistance; PowerPC 603; PowerPC 604; PowerPC microprocessor; computational fluid dynamics; conjugate conduction analysis; conjugate heat transfer features; critical design parameters; flow bypass effects; heat sink; module thermal performance; module thermal resistances; multichip modules; power distributions; thermal management; Computational fluid dynamics; Energy management; Heat sinks; Microprocessors; Multichip modules; Performance analysis; Resistance heating; Thermal conductivity; Thermal management; Thermal resistance;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1997. SEMI-THERM XIII., Thirteenth Annual IEEE
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-3793-X
DOI :
10.1109/STHERM.1997.566803